Advantages
P r i n c i p l e | Leeb hardness measurement | HARTIP 3210 main unit |
A c c u r a c y | ±0.3% @ HL=800, Repeatability: ±2HL | Probe D (cable or RF) |
D i s p l a y | 2.8” 320 x 240 TFT color LCD – fittable under sunshine | Test block D |
H a r d n e s s s c a l e | HL / HRC / HRB / HB / HV / HS / HRA /σb | Small support ring |
M e a s u r i n g r a n g e | HL100-960 / HRC0.9-83.2 / HRB1-140 / HB1-1878 / HV1-1698 / HS0.5-1370 / HRA1-88.5 / σb(rm)1-6599N/mm 2 |
Cleaning brush |
P r o b e | DC / D+15 / C / G / E / DL (Optional) | PC software |
r / f c o m m u n i c a t i o n d i s t a n c e | 10m in space | Operation manual |
r / f f r e q u e n c y | 2.4GHz | Test certificate |
I m p a c t d i r e c t i o n | Universal angle type | Carrying case |
M a t e r i a l s a n d c o n v e r s i o n c u r v e s |
11 common metal materials, 60 conversion curves | |
M e m o r y | 63 files, 100 data for each file, can be saved and re-readable | O p t i o n a l A c c e s s o r i e s |
S t a t i s t i c s | Single group analysis — mean, max., min., extreme deviation, standard deviation, coefficient of kurtosis, coefficient of skewness, percent of pass, column diagram, normality distribution test and uniform distribution test Double group analysis — significant difference test for mean value, standard deviation, percent of pass and distribution |
Cable probe D/DC/ D+15/C/G/E/DL |
Re-calibration | Calibration for unified or individual scale | RF Wireless probe D/ DC/D+15/C/E/DL |
Indicator | Upper limit / Lower limit / low battery / buzzer warning / date and time |
Digital probe D/DC/ D+15/C/E/DL |
Language | E n g l i s h , S i m p l i f i e d C h i n e s e , Tr a d i t i o n a l C h i n e s e , R u s s i a n , K o r e a n, F r e n c h , I t a l i a n , G e r m a n , Tu r k i s h , S p a n i s h | Bluetooth micro printer |
Communication inter face | U S B / R S 2 3 2 / B l u e t o o t h / 2 . 4 G w i r e l e s s ( O p t i o n a l ) | Standard block G |
Continous working time | >40 hours | Special support rings |
P o w e r s u p p l y | 1.5V AA alkaline battery x 4 / 1.2V nickel-hydrogen rechargerable battery x 4 / 3.7V Li-ion rechargeable battery x 4 / USB power supply |
USB charging cable for wireless probe |
W o r k i n g e n v i r o n m e n t | -10ºC~+45ºC | USB charger |
D i m e n s i o n ( m m ) | 195 x 84 x 38 | USB data cable |
N e t w e i g h t ( g ) | 550 | Leather case |
S t a n d a r d s | Conforming to ASTM A956, DIN 50156, GB/T 17394-1998 |
S pecifications
H ARTIP 3210 is a new generation of Leeb hardness tester with more advanced technol ogy and features. The tester applies our new patent dual-coil sensor technology which –
makes the tester more accurate than old previous model. All
probe are no need to setup impact direction. HARTIP 3210
can work with analogy, digital and wireless RF probe.
The measuring values can be downloaded to PC and
printer by Bluetooth or cable.
The HARTIP 3210 also can be powered by USB power
supply without battery via PC cable.
W i r e l e s s / d i g i t a l / c a b l e a n a l o g u e c o m p a t i b l e
C o n v e r t b e t w e e n e a c h h a r d n e s s s c a l e
N o n e e d t o s e t u p d i f f e r e n t i m p a c t d i r e c t i o n
H i g h e r a c c u r a c y w i t h d u a l – c o i l t e c h n o l o g y
T F T l a r g e c o l o r LC D w i t h p i x e l 3 2 0 x 2 4 0
M u l t i c o l o r s t y l e – f i t t a b l e u n d e r s u n s h i n e
M u l t i d i s p l a y m o d e – s t a t i s t i c s , b a r g r a p h , e t c .
M u l t i s a v e m o d e f o r d a t a
M u l t i s t a t i s t i c s c a l c u l a t i o n
P r i n t o n l i n e a n d s c r e e n c o p y p r i n t o u t
S o u n d r e m i n d e r
R e a l d a t e a n d t i m e
R e c a l i b r a t i o n f o r u n i f i e d o r i n d i v i d u a l s c a l e
O p e r a t o r, p a r t n o. , p r o c e d u r e n o. r e c o r d
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