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HARTIP 3210

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HARTIP 3210

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Advantages

P r i n c i p l e Leeb hardness measurement HARTIP 3210 main unit
A c c u r a c y ±0.3% @ HL=800, Repeatability: ±2HL Probe D (cable or RF)
D i s p l a y 2.8” 320 x 240 TFT color LCD – fittable under sunshine Test block D
H a r d n e s s s c a l e HL / HRC / HRB / HB / HV / HS / HRA /σb Small support ring
M e a s u r i n g r a n g e HL100-960 / HRC0.9-83.2 / HRB1-140 / HB1-1878 / HV1-1698 /
HS0.5-1370 / HRA1-88.5 / σb(rm)1-6599N/mm
2
Cleaning brush
P r o b e DC / D+15 / C / G / E / DL (Optional) PC software
r / f c o m m u n i c a t i o n d i s t a n c e 10m in space Operation manual
r / f f r e q u e n c y 2.4GHz Test certificate
I m p a c t d i r e c t i o n Universal angle type Carrying case
M a t e r i a l s a n d c o n v e r s i o n
c u r v e s
11 common metal materials, 60 conversion curves
M e m o r y 63 files, 100 data for each file, can be saved and re-readable O p t i o n a l A c c e s s o r i e s
S t a t i s t i c s Single group analysis — mean, max., min., extreme deviation,
standard deviation, coefficient of kurtosis, coefficient of skewness,
percent of pass, column diagram, normality distribution test and
uniform distribution test
Double group analysis — significant difference test for mean value,
standard deviation, percent of pass and distribution
Cable probe D/DC/
D+15/C/G/E/DL
Re-calibration Calibration for unified or individual scale RF Wireless probe D/
DC/D+15/C/E/DL
Indicator Upper limit / Lower limit / low battery / buzzer warning / date and
time
Digital probe D/DC/
D+15/C/E/DL
Language E n g l i s h , S i m p l i f i e d C h i n e s e , Tr a d i t i o n a l C h i n e s e , R u s s i a n , K o r e a n, F r e n c h , I t a l i a n , G e r m a n , Tu r k i s h , S p a n i s h Bluetooth micro printer
Communication inter face U S B / R S 2 3 2 / B l u e t o o t h / 2 . 4 G w i r e l e s s ( O p t i o n a l ) Standard block G
Continous working time >40 hours Special support rings
P o w e r s u p p l y 1.5V AA alkaline battery x 4 / 1.2V nickel-hydrogen rechargerable
battery x 4 / 3.7V Li-ion rechargeable battery x 4 / USB power supply
USB charging cable for
wireless probe
W o r k i n g e n v i r o n m e n t -10ºC~+45ºC USB charger
D i m e n s i o n ( m m ) 195 x 84 x 38 USB data cable
N e t w e i g h t ( g ) 550 Leather case
S t a n d a r d s Conforming to ASTM A956, DIN 50156, GB/T 17394-1998

S pecifications
H ARTIP 3210 is a new generation of Leeb hardness tester with more advanced technol ogy and features. The tester applies our new patent dual-coil sensor technology which –
makes the tester more accurate than old previous model. All
probe are no need to setup impact direction. HARTIP 3210
can work with analogy, digital and wireless RF probe.
The measuring values can be downloaded to PC and
printer by Bluetooth or cable.
The HARTIP 3210 also can be powered by USB power
supply without battery via PC cable.
› W i r e l e s s / d i g i t a l / c a b l e a n a l o g u e c o m p a t i b l e
› C o n v e r t b e t w e e n e a c h h a r d n e s s s c a l e
› N o n e e d t o s e t u p d i f f e r e n t i m p a c t d i r e c t i o n
› H i g h e r a c c u r a c y w i t h d u a l – c o i l t e c h n o l o g y
› T F T l a r g e c o l o r LC D w i t h p i x e l 3 2 0 x 2 4 0
› M u l t i c o l o r s t y l e – f i t t a b l e u n d e r s u n s h i n e
› M u l t i d i s p l a y m o d e – s t a t i s t i c s , b a r g r a p h , e t c .
› M u l t i s a v e m o d e f o r d a t a
› M u l t i s t a t i s t i c s c a l c u l a t i o n
› P r i n t o n l i n e a n d s c r e e n c o p y p r i n t o u t
› S o u n d r e m i n d e r
› R e a l d a t e a n d t i m e
› R e c a l i b r a t i o n f o r u n i f i e d o r i n d i v i d u a l s c a l e
› O p e r a t o r, p a r t n o. , p r o c e d u r e n o. r e c o r d

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